The technological capabilities in the research building Laboratory of Nano and Quantum Engineering have been extended by a further, important major instrumentation: A transmission electron microscope, TEM shortly.
In a TEM electrons are accelerated with high voltage and irradiated through very thin samples, so that the image contains direct information on the interior of the sample. It achieves resolutions in the nanometer range. In crystalline samples, it is possible to map the arrangements of individual atoms.
The new TEM in the LNQE has an accelerating voltage of 200 kV and an electron field effect emitter cathode. Important parameters are:
- Device Type: TEM Tecnai G2 F20 TMP of FEI Co.
- 200 kV FEG field-effect
- Oil-free vacuum
- TEM point resolution: 0.27 nm
- Information limit: 0.14 nm (measured!)
- STEM resolution: 0.24 nm
- 1 bright-field and 2 dark-field detectors +1 HAADF detector
- Tomography + - 70 ° (possibly up to + - 80 °)
With this TEM all classical contrast methods are possible: bright field and dark field, diffraction contrast (including weak-beam), parallel illumination at all magnifications (especially important in the investigation of crystalline samples), TEM and STEM (scanning TEM). While large tilt angle are possible. A special feature of the new TEM is the ability of the tomography.
